The F-Scan GO is a fully cordless in-shoe system for quick and natural gait analysis for clinicians & clinical researchers. The Wi-Fi enabled system works with cordless ankle units to combine the high scanning speed and spatial resolution of the current F-Scan systems with fully wireless electronics and datalogging. It provides essential gait analysis parameters like pressure and force data, timing parameters and Center of Force (CoF).
Cord-free wearable ultralight electronics encourages natural movement. No cables or cords, and no distance limitations allowed full freedom of movement for any advanced gait study.
The highest resolution sensors available provide accurate in-shoe measurements. Having the ability to compare peak pressures before and after orthotic intervention greatly enhances the efficacy of treatment. The F-Scan go gives you the most sensor data points at highest scan rates for the most detailed and accurate gait assessment on the market.
Perfect for both the gait lab and in the field, the versatility of F-Scan GO makes it the preferred choice for use in applications that are central to Biomechanics research. It is highly portable and can be used in almost any environment, its data can be easily exported, and it synchronizes with external devices; such as EMG and Motion Capture, through external trigger input controls.
The combination of Wi-Fi control and onboard storage combines the speed of Wi-Fi control and realtime communication with the unlimited range of a data-logging system that automatically syncs for easy control of dynamic measurements in sports activities.
Tekscan’s next generation of research software – improved interface, more intuitive, and enhanced for use with a tablet. FootVIEW simplifies data collection and analysis and provides a user-friendly layout using docking regions that allows the user to easily organize information in dashboards.
The F-Scan GO is the next generation of F-Scan system from Tekscan. Biomechanics and gait researchers have relied on F-Scan systems for years in countess peer-reviewed published papers. We continue that legacy with the most sensor data at the highest scan rates in the industry delivered by systems researcher rely upon for their critical work.
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